BOCA RATON PATENT LAWYER

     Peter A. Koziol, Esq.
     Assouline & Berlowe, P.A.
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     Boca Raton, Florida 33431
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BOCA PATENTS BY
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Multi-layer chip overlay target and measurement

Invented by: Christopher P. Ausschnitt
Boca Raton, FL

Allen H. Gabor
Hopewell Junction, NY

Nelson M. Felix
Hopewell Junction, NY

Originally Assigned to: International Business Machines Corporation
Armonk, NY
[Now assigned to . . .]

Issued:2013-01-29
Filed:2010-04-09
Application No:12757344
Examined by:Young; Christopher

A wafer includes an active region and a kerf region surrounding at least a portion of the active region. The wafer also includes a target region having a rectangular shape with a width and a length greater than the width, the target region including one or more target patterns, at least one of the target patterns being formed by two sub-patterns disposed at opposing corners of a target rectangle disposable within the target region.

[pdf] U.S. Pat. No. 8,361,683

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