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Apparatus and method for indirect surface cleaning

Invented by: Jeffrey E. LeClaire
Boca Raton, FL

Kenneth G. Roessler
Boca Raton, FL

David Brinkley
Baltimore, MD Applicant: Name City State Country Type Rave, LLC Delray Beach FL US

Originally Assigned to: RAVE LLC
Palo Alto, CA Family ID: 1000001707176
[Now assigned to . . .]

Issued:2016-03-15
Filed:2015-03-12
Application No:14656206
Examined by:Blan; Nicole

A photomask includes at least one feature disposed thereon. The at least one feature has an associated design location, where a distance between a location of the at least one feature and the associated design location defines a positional error of the at least one feature. A method for improving a performance characteristic of the photomask includes directing electromagnetic radiation toward the photomask, the electromagnetic radiation having a wavelength that substantially coincides with a high absorption coefficient of the photomask; generating a thermal energy increase in the photomask through incidence of the electromagnetic radiation thereon; and decreasing the positional error as a result of the generating the thermal energy increase in the photomask.

[pdf] U.S. Pat. No. 9,285,674

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